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Beilstein J. Nanotechnol. 2019, 10, 1648–1657, doi:10.3762/bjnano.10.160
Figure 1: Schematic of the transmission helium ion microscope (THIM).
Figure 2: For a BN sample, the voltage of Lens 2 was decreased from (A) to (E). A) A shadow image, B) a highe...
Figure 3: Examples of overfocus bright outline deflection patterns (A and D), underfocus spot patterns (B and...
Figure 4: A) HIM SE image with charge compensation by electron flooding and B) HIM SE image without charge co...
Figure 5: A) A THIM through-focus series of the MgO sample (coated with 10 nm Au on both sides) produced by d...